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Guangdong Yuanyao Test Equipment Co.,Ltd.
Guangdong Yuanyao Test Equipment Co.,Ltd.

Semiconductor Environmental Testing Equipment and Testing Standards

As the foundation of modern electronic technology, the semiconductor industry has extremely high requirements for product performance and stability. To ensure that semiconductor devices can operate normally in various environments, semiconductor environmental testing equipment has become an indispensable tool in the research and development and production processes. This article will introduce several common semiconductor environmental testing devices and the testing standards they need to meet.


Common semiconductor environmental testing devices


High and Low Temperature Test Chamber


High and low temperature test chambers can simulate various environments from extremely low temperatures to high temperatures, testing the performance of semiconductor devices under different temperature conditions. This equipment is crucial for evaluating the temperature range and stability of semiconductor products. Through high and low temperature test chambers, manufacturers can verify the reliability and performance of semiconductor devices in extreme temperatures.


Humidity and Heat Test Chamber


Humidity and heat test chambers are mainly used to simulate high humidity environments, testing the performance of semiconductors under high humidity conditions. By simulating different humidity conditions, the moisture resistance of semiconductor devices can be tested. This is particularly important for semiconductor products used in humid environments and helps ensure their long-term stable operation.


Vibration Test Equipment


Vibration test equipment simulates various vibration environments to test the shock resistance of semiconductor devices. This equipment can simulate the vibrations and impacts that may be encountered during transportation and actual use, ensuring that semiconductor products can withstand various vibratory stresses in practical applications, thereby ensuring their reliability.


Salt Spray Test Chamber


Salt spray test chambers simulate marine environments to test the corrosion resistance of semiconductors in salt spray environments. This is very important for evaluating the reliability of semiconductor products used in harsh environments. Salt spray test chambers help manufacturers understand the corrosion resistance of semiconductor products in high salinity environments, ensuring their long-term stable operation under such conditions.


Aging Test Chamber


Aging test chambers simulate long-term use environments and accelerate the aging process of semiconductor devices to assess their lifespan and reliability. Through aging tests, manufacturers can estimate the service life of semiconductor products, ensuring their long-term reliability in actual applications.


Comprehensive Environmental Test Chamber


Comprehensive environmental test chambers are multi-functional testing equipment that can simulate multiple environmental factors such as temperature, humidity, vibration, and salt spray to conduct comprehensive environmental adaptability tests on semiconductor devices. The multifunctionality of this equipment makes it an indispensable part of semiconductor environmental testing, helping manufacturers fully understand the performance of products in various environments.


Testing Standards for Semiconductor Environmental Testing


When conducting semiconductor environmental testing, corresponding national standards must be followed to ensure consistency and accuracy of the tests. Here are some key testing standards:

Temperature Cycling Test Standards


Regarding temperature cycling (thermal shock) testing, based on JESD22-A104 standards, testing the performance of semiconductors under extreme temperature changes. This standard defines the temperature range (-65℃~150℃), shock temperatures (-40℃,-55℃,-65℃ and65℃,85℃,125℃), shock time (less than3 minutes), holding time (30 to60 minutes) and total test cycles (no less than1000 cycles).


Temperature, Pressure/UnbiasedHAST Testing Standards


Regarding temperature, pressure/unbiasedHAST testing, the JESD22-A118 standard is followed, specifying the temperature range (100℃143℃), humidity range (70%RH100%RH), pressure range (0.5kg~3.5kg) and test time (no less than200 hours, with some requirements extending to500 to1000 hours).


Other relevant testing standards include the low temperature test method and high temperature test method in GB/T 2423.1-2001, the high temperature and low temperature test specified in GJB 150.3-1986, and the technical conditions for high temperature test chambers specified in GB 11158. These standards all provide detailed operational guidelines and requirements for semiconductor environmental testing.


In summary, semiconductor environmental testing equipment plays a crucial role in the semiconductor industry. Through rigorous environmental testing and adhering to relevant testing standards, manufacturers can ensure that their semiconductor products have high performance and reliability under various environmental conditions, thereby meeting market and consumer demands.

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